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dc.contributor.authorJiménez-Rey, David
dc.contributor.authorPeña-Rodríguez, Ovidio
dc.contributor.authorManzano-Santamaría, Javier
dc.contributor.authorOlivares, José
dc.contributor.authorMuñoz-Martín, Angel
dc.contributor.authorRivera, Antonio C.
dc.contributor.authorAgulló López, Fernando 
dc.contributor.otherUAM. Departamento de Física de Materialeses_ES
dc.date.accessioned2015-04-29T10:56:10Z
dc.date.available2015-04-29T10:56:10Z
dc.date.issued2012-09-01
dc.identifier.citationNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 286 (2012): 282-286en_US
dc.identifier.issn0168-583X (Print)es_ES
dc.identifier.urihttp://hdl.handle.net/10486/665632
dc.description.abstractIonoluminescence (IL) of the two SiO 2 phases, amorphous silica and crystalline quartz, has been comparatively investigated in this work, in order to learn about the structural defects generated by means of ion irradiation and the role of crystalline order on the damage processes. Irradiations have been performed with Cl at 10 MeV and Br at 15 MeV, corresponding to the electronic stopping regime (i.e., where the electronic stopping power S e is dominant) and well above the amorphization threshold. The light-emission kinetics for the two main emission bands, located at 1.9 eV (652 nm) and 2.7 eV (459 nm), has been measured under the same ion irradiation conditions as a function of fluence for both, silica and quartz. The role of electronic stopping power has been also investigated and discussed within current views for electronic damage. Our experiments provide a rich phenomenological background that should help to elucidate the mechanisms responsible for light emission and defect creationen_US
dc.description.sponsorshipThis work has been supported by Spanish Ministry MICINN through the project MAT-2008-06794-C03-03, JCI-2009-05681, and by Madrid Community through the project TECHNOFUSION (S2009/ENE-1679). OPR is grateful to CONACyT, Mexico, for extending a postdoctoral fellowshipen_US
dc.format.extent18 pag.es_ES
dc.format.mimetypeapplication/pdfes_ES
dc.language.isoengen
dc.publisherElsevier B.V.en_US
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atomsen_US
dc.rights© 2011 Elsevier B.V. All rights reserveden_US
dc.subject.otherIon damageen_US
dc.subject.otherIon irradiationen_US
dc.subject.otherQuartzen_US
dc.subject.otherSilicaen_US
dc.subject.otherSiO 2en_US
dc.subject.otherSwift heavy ionsen_US
dc.titleIonoluminescence induced by swift heavy ions in silica and quartz: A comparative analysisen_US
dc.typearticleen
dc.subject.ecienciaFísicaes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.nimb.2011.12.025es_ES
dc.identifier.doi10.1016/j.nimb.2011.12.025es_ES
dc.identifier.publicationfirstpage282es_ES
dc.identifier.publicationlastpage286es_ES
dc.identifier.publicationvolume286es_ES
dc.relation.projectIDComunidad de Madrid. S2009/ENE-1679/TECHNOFUSIONes_ES
dc.type.versioninfo:eu-repo/semantics/acceptedVersionen
dc.rights.ccReconocimiento – NoComercial – SinObraDerivadaes_ES
dc.rights.accessRightsopenAccessen
dc.authorUAMAgullo López, Fernando (258914)
dc.facultadUAMFacultad de Ciencias
dc.institutoUAMCentro de Micro-Análisis de Materiales (CMAM)


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