Method to calculate electric fields at very small tip-sample distances in atomic force microscopy

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dc.contributor.author Sacha, Gómez Moñivas
dc.contributor.other UAM. Departamento de Ingeniería Informática es_ES
dc.date.accessioned 2015-05-20T16:58:57Z
dc.date.available 2015-05-20T16:58:57Z
dc.date.issued 2010-07-19
dc.identifier.citation Applied Physics Letters 97(2010): 033115 en_US
dc.identifier.issn 0003-6951 (print) en_US
dc.identifier.issn 1077-3118 (online) en_US
dc.identifier.uri http://hdl.handle.net/10486/666290
dc.description Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. en_US
dc.description.abstract A method to calculate electric magnitudes at very small tip-sample distances in atomic force microscopy is presented. We show that the method accurately calculates the electrostatic potential and vertical force for electrostatic force microscopy geometries that cannot be correctly simulated by the standard techniques. This technique can accurately calculate tip-sample distances four orders of magnitude smaller than the tip radius. We also demonstrate that, at this range, traditional techniques underestimate the electrostatic force in almost 30%. Finally, we calculate the jump-to-contact distance for geometries obtained from experiments that combine atomic force microscopy and scanning tunneling microscopy. en_US
dc.description.sponsorship J. J. Sáenz, P. Varona, E. Serrano, and F. Rodríguez for insightful discussions. This work was supported by Ministerio de Educación y Ciencia Grant Nos. TIN 2007-65989 and Comunidad Autonoma de Madrid S-SEM-0255-2006 en_US
dc.format.extent 4 pág. es_ES
dc.format.mimetype application/pdf en
dc.language.iso eng en
dc.publisher A I P Publishing LLC en_US
dc.relation.ispartof Applied Physics Letters en_US
dc.rights © 2010 American Institute of Physics en_US
dc.title Method to calculate electric fields at very small tip-sample distances in atomic force microscopy en_US
dc.type article en_US
dc.subject.eciencia Informática es_ES
dc.relation.publisherversion http://dx.doi.org/10.1063/1.3467676
dc.identifier.doi 10.1063/1.3467676
dc.identifier.publicationfirstpage 033115
dc.identifier.publicationissue 3
dc.identifier.publicationlastpage 033115
dc.identifier.publicationvolume 97
dc.relation.projectID Comunidad de Madrid. S2006/SEM-0255/OLFACTOSENSE es_ES
dc.type.version info:eu-repo/semantics/publishedVersion en
dc.contributor.group Neurocomputación Biológica (ING EPS-005) es_ES
dc.rights.accessRights openAccess en


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