Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy
Entity
UAM. Departamento de Ingeniería InformáticaPublisher
A I P Publishing LLCDate
2009-06-26Citation
10.1063/1.3149770
Applied Physics Letters 94.23 (2009): 233105
ISSN
0003-6951 (print); 1077-3118 (online)DOI
10.1063/1.3149770Funded by
This work was supported by the Ministerio de Educación y Ciencia MEC , Spain, through Grant No. FIS2006-12117- C04-01, and by the EXPLORA program NAN2007-29375-E. We thank J. L. Masa-Campos and J. J. Sáenz for their interesting discussions on the electrostatics of our system.Editor's Version
http://dx.doi.org/10.1063/1.3149770Subjects
Charge injection; Graphene; Thin films; Scanning probe microscopes; Silicon; InformáticaNote
Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.Rights
Copyright 2009 American Institute of PhysicsAbstract
By means of scanning probe microscopy we are able to inject charges in isolated graphene sheets
deposited on SiO2 / Si wafers and characterize the discharge induced by water in controlled ambient
conditions. Contact potential differences between the graphene surface and the probe tip, measured
by Kelvin probe microscopy, show a linear relationship with the tip bias during charge injection.
The discharge depends on relative humidity and decays exponentially with time constants of the
order of tens of minutes. We propose that graphene discharges through the water film adsorbed on
the SiO2 surface. © 2009 American Institute of Physics.
Files in this item
Google Scholar:Verdaguer, A.
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Cardellach, M.
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Segura, J. J.
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Gómez Moñivas, Sacha
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Moser, J.
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Zdrojek, M.
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Bachtold, A.
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Fraxedas, J.
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