Show simple item record

dc.contributor.authorYurtsever, Ayhan
dc.contributor.authorFernández-Torre, Delia
dc.contributor.authorGonzález, César
dc.contributor.authorJelínek, Pavel
dc.contributor.authorPou Bell, Pablo 
dc.contributor.authorSugimoto, Yoshiaki
dc.contributor.authorAbe, Masayuki
dc.contributor.authorPérez Pérez, Rubén 
dc.contributor.authorMorita, Seizo
dc.contributor.otherUAM. Departamento de Física Teórica de la Materia Condensadaes_ES
dc.date.accessioned2016-04-07T14:49:23Z
dc.date.available2016-04-07T14:49:23Z
dc.date.issued2012-03-13
dc.identifier.citationPhysical Review B 85.12 (2012): 125416en_US
dc.identifier.issn1098-0121 (print)es_ES
dc.identifier.issn1550-235X (online)es_ES
dc.identifier.urihttp://hdl.handle.net/10486/670535
dc.description.abstractSite-specific force measurements on a rutile TiO 2(110) surface are combined with first-principles calculations in order to clarify the origin of the force contrast and to characterize the tip structures responsible for the two most common imaging modes. Our force data, collected over a broad range of distances, are only consistent with a tip apex contaminated with clusters of surface material. A flexible model tip terminated with an oxygen explains the protrusion mode. For the hole mode we rule out previously proposed Ti-terminated tips, pointing instead to a chemically inert, OH-terminated apex. These two tips, just differing in the terminal H, provide a natural explanation for the frequent contrast changes found in the experiments. As tip-sample contact is difficult to avoid while imaging oxide surfaces, we expect our tip models to be relevant to interpret scanning probe studies of defects and adsorbates on TiO 2 and other technologically relevant metal oxidesen_US
dc.description.sponsorshipWe thank the MEXT (19053006, 22221006, 21246010, 21656013, 20760024, and 22760028), JST, Handai FRC (Japan), and the spanish MICINN (MAT2008-1497, CSD2007-41, MAT2008-02929, MAT2008-02939-E, MAT2008-02953-E, PLE2009-0061, CSD2010-00024) for financial support. P.J. thanks ME10076. Y.S., C.G., and P.P. thank, respectively, Funding Program for Next Generation World-Leading Researchers, a CSIC JAE-Doc contract, and the Ramon y Cajal Program (MICINN)en_US
dc.format.extent9 pag.es_ES
dc.format.mimetypeapplication/pdfen
dc.language.isoengen
dc.relation.ispartofPhysical Review B - Condensed Matter and Materials Physicsen_US
dc.rights© 2012 American Physical Societyen_US
dc.titleUnderstanding image contrast formation in TiO 2 with force spectroscopyen_US
dc.typearticleen
dc.subject.ecienciaFísicaes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1103/PhysRevB.85.125416es_ES
dc.identifier.doi10.1103/PhysRevB.85.125416es_ES
dc.identifier.publicationfirstpage125416es_ES
dc.identifier.publicationissue12es_ES
dc.identifier.publicationlastpage125416es_ES
dc.identifier.publicationvolume85es_ES
dc.relation.projectIDGobierno de España. MAT2008- 1497es_ES
dc.relation.projectIDGobierno de España. CSD2007-41es_ES
dc.relation.projectIDGobierno de España. MAT2008-02929es_ES
dc.relation.projectIDGobierno de España. MAT2008-02939-Ees_ES
dc.relation.projectIDGobierno de España. MAT2008-02953-Ees_ES
dc.relation.projectIDGobierno de España. PLE2009-0061es_ES
dc.relation.projectIDGobierno de España. CSD2010-00024es_ES
dc.type.versioninfo:eu-repo/semantics/publishedVersionen
dc.rights.accessRightsopenAccessen
dc.authorUAMPou Bell, Pablo (262784)
dc.facultadUAMFacultad de Ciencias


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record