High-order localized spoof surface plasmon resonances and experimental verifications
Entity
UAM. Departamento de Física Teórica de la Materia CondensadaPublisher
Nature Publishing GroupDate
2015-04-15Citation
10.1038/srep09590
Scientific Reports 5 (2015): 9590
ISSN
2045-2322DOI
10.1038/srep09590Funded by
This work was supported in part by the National Science Foundation of China (60990320, 60990321, 60990324, 61171024, 61171026, and 61138001), in part by the National High Tech (863) Projects (2012AA030402 and 2011AA010202), in part by the 111 Project (111-2-05), in part by the Scientific Research Foundation of Graduate School of Southeast University (Grant No. YBJJ1436), in part by the Program for Postgraduates Research Innovation in University of Jiangsu Province (Grant No. 3204004910) and in part by the Fundamental Research Funds for the Central Universities. Y.L. and S.A.M. are supported by the Leverhulme trust. Y.L. would like to acknowledge the funding support from NTU-A*STAR Silicon Technologies Centre of Excellence under the program grant No. 11235150003Editor's Version
http://dx.doi.org/10.1038/srep09590Subjects
High-order; Spoof; Surface plasmon; Electromagnetic modes; Microwave frequencies.; FísicaAbstract
We theoretically demonstrated and experimentally verified high-order radial spoof localized surface plasmon resonances supported by textured metal particles. Through an effective medium theory and exact
numerical simulations, we show the emergence of these geometrically-originated electromagnetic modes at microwave frequencies. The occurrence of high-order radial spoof plasmon resonances is experimentally verified in ultrathin disks. Their spectral and near-field properties are characterized experimentally, showing an excellent agreement with theoretical predictions. Our findings shed light into the nature of spoof localized surface plasmons, and open the way to the design of broadband plasmonic devices able to operate at
very different frequency regimes
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Google Scholar:Liao, Zhen
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Luo, Yu
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Fernández Domínguez, Antonio Isaac
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Shen, Xiaopeng
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Maier, Stefan A.
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Cui, Tie Jun
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