A multi-technique approach to understanding delithiation damage in LiCoO thin films
Entity
UAM. Departamento de Física de la Materia Condensada; UAM. Departamento de Física de MaterialesPublisher
Nature ResearchDate
2021-12-01Citation
10.1038/s41598-021-91051-3
Scientific Reports 11.1 (2021): 12027
ISSN
2045-2322 (online)DOI
10.1038/s41598-021-91051-3Project
Gobierno de España. MAT2017-83722-R; Gobierno de España. CEX2018-000805-M; Comunidad de Madrid. SI1/PJI/2019–00124Editor's Version
https://doi.org/10.1038/s41598-021-91051-3Subjects
Lithium-Ion Batteries; Electrode; Electrochemical Properties; FísicaRights
© The Author(s) 2021Abstract
We report on the delithiation of LiCoO2 thin films using oxalic acid (C2H2O4) with the goal of understanding the structural degradation of an insertion oxide associated with Li chemical extraction. Using a multi-technique approach that includes synchrotron radiation X-ray diffraction, scanning electron microscopy, micro Raman spectroscopy, photoelectron spectroscopy and conductive atomic force microscopy we reveal the balance between selective Li extraction and structural damage. We identify three different delithiation regimes, related to surface processes, bulk delithiation and damage generation. We find that only a fraction of the grains is affected by the delithiation process, which may create local inhomogeneities. However, the bulk delithiation regime is effective to delithiate the LCO film. All experimental evidence collected indicates that the delithiation process in this regime mimics the behavior of LCO upon electrochemical delithiation. We discard the formation of Co oxalate during the chemical extraction process. In conclusion, the chemical route to Li extraction provides additional opportunities to investigate delithiation while avoiding the complications associated with electrolyte breakdown and simplifying in-situ measurements
Files in this item
Google Scholar:Salagre Rubio, Elena
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Quílez, S.
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Benito, S., de
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Jaafar Ruiz-Castellanos, Miriam
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Van Der Meulen, Herko Piet
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Herrera Vasco, Edwin
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Cid, R.
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Fuller, E. J.
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Talin, A. A.
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Segovia Cabrero, María Pilar
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García Michel, Enrique
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Polop Jordá, Celia
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