Extracting transport channel transmissions in scanning tunneling microscopy using superconducting excess current
Entidad
UAM. Departamento de Física Teórica de la Materia CondensadaEditor
American Physical SocietyFecha de edición
2022-04-01Cita
10.1103/PhysRevB.105.165401
Physical Review B 105.16 (2022): 165401
ISSN
2469-9950 (print); 2469-9969 (online)DOI
10.1103/PhysRevB.105.165401Proyecto
info:eu-repo/grantAgreement/EC/H2020/681164/ERC//AbsoluteSpin; Gobierno de España. PID2020-114880GB-I00Versión del editor
https://doi.org/10.1103/PhysRevB.105.165401Materias
Atomic Scale Junction; Channel Transmission; Conduction Channel; Excess Current; Multiple Andreev Reflections; Scanning Tunnelling Microscopes; Transport Channel; FísicaDerechos
© 2022 authorsResumen
Transport through quantum coherent conductors, such as atomic junctions, is described by conduction
channels. Information about the number of channels and their transmissions can be extracted from various
sources, such as multiple Andreev reflections, dynamical Coulomb blockade, or shot noise. We complement
this set of methods by introducing the superconducting excess current as a new tool to continuously extract the
transport channel transmissions of an atomic scale junction in a scanning tunneling microscope. In conjunction
with ab initio simulations, we employ this technique in atomic aluminum junctions to determine the influence of
the structure adjacent to the contact atoms on the transport properties
Lista de ficheros
Google Scholar:Senkpiel, Jacob
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Drost, Robert
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Klöckner, Jan C.
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Etzkorn, Markus
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Ankerhold, Joachim
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Cuevas Rodríguez, Juan Carlos
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Pauly, Fabian
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Kern, Klaus
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Ast, Christian R.
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