GaSb/Mn multilayers structures fabricated by DC magnetron sputtering: Interface feature and nano-scale surface topography
Entity
UAM. Departamento de Física de MaterialesPublisher
SpringerDate
2022-03-05Citation
10.1007/s10854-022-07965-9
Journal of Materials Science: Materials in Electronics 33.10 (2022): 8159 - 8170
ISSN
0957-4522 (print); 1573-482X (online)DOI
10.1007/s10854-022-07965-9Editor's Version
https://doi.org/10.1007/s10854-022-07965-9Subjects
GaSb/Mn multilayers; Multilayer structure; Electronic applications; Spintronic devices; FísicaRights
© The Author(s)Abstract
The multilayer structure is a well-studied architecture for electronic and optoelectronic applications and more recently in spintronic devices. In this work, we present the structural, morphological, topographical, and magnetic properties of GaSb/Mn multilayers deposited via DC magnetron sputtering at room temperature and 423 K. Raman measurements evidence the formation of p-type GaSb layers with a contribution of electrons in the multilayer due to the neighboring Mn layer and the formation of effective interlayers. HR-SEM measurements show the multilayer architecture with columnar microstructure in the layer’s formation, while AFM micrographs allowed observing the changes in grain sizes (between 129 and 187 nm) and roughness (between 1.47 nm and 6.28 nm) with increasing number of layers. The formation of the interlayers between the GaSb and Mn layer was assayed in-depth spectroscopically via Rutherford backscattering studies. These interlayers were associated with diffusion processes during deposition and contributed to the magnetic behavior of multilayers. A ferromagnetic-like behavior was observed in the multilayers
Files in this item
Google Scholar:Calderón, Jorge A.
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Quiroz, Heiddy P.
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Manso Silván, Miguel
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Muñoz Noval, Álvaro
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Dussan, A.
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Méndez, H.
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