On the true optical properties of zinc nitride
Entity
UAM. Departamento de Física AplicadaPublisher
American Institute of PhysicsDate
2011Citation
10.1063/1.3663859
Applied Physics Letters 99.23 (2011): 232112-3
ISSN
1077-3118DOI
10.1063/1.3663859Editor's Version
http://dx.doi.org/10.1063/1.3663859Subjects
Zinc oxide films; Ellipsometry; Rutherford backscattering; FísicaNote
Copyright (2011) American Institute of Physics. The following article appeared in Applied Physics Letters 99.23 (2011): 232112-3 and may be found at http://apl.aip.org/Files in this item
Google Scholar:García Núñez, C.
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Pau Vizcaíno, José Luis
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Hernández Muñoz, María Jesús
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Cervera Goy, Manuel
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Piqueras, Juan
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