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On the true optical properties of zinc nitride

Author
García Núñez, C.; Pau, José Luis; Hernández, M. J.; Cervera Goy, Manueluntranslated; Piqueras, Juan
Publisher
American Institute of Physics
Date
2011
Citation
Applied Physics Letters 99.23 (2011): 232112-3
ISSN
1077-3118
DOI
10.1063/1.3663859
Editor's Version
http://dx.doi.org/10.1063/1.3663859
Subjects
Zinc oxide films; Ellipsometry; Rutherford backscattering; Física
URI
http://hdl.handle.net/10486/13947
Note
Copyright (2011) American Institute of Physics. The following article appeared in Applied Physics Letters 99.23 (2011): 232112-3 and may be found at http://apl.aip.org/
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Google™ Scholar:García Núñez, C. - Pau, José Luis - Hernández, M. J. - Cervera Goy, Manuel - Piqueras, Juan

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