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dc.contributor.authorPreda, Iulian
dc.contributor.authorSoriano Guillén, Leandro 
dc.contributor.authorDíaz-Fernández, Daniel
dc.contributor.authorDomínguez-Cañizares, Guillermo
dc.contributor.authorGutiérrez, Alejandro
dc.contributor.authorCastro, Germán Rafael
dc.contributor.authorChaboy, Jesús
dc.contributor.otherUAM. Departamento de Física Aplicadaes_ES
dc.date.accessioned2015-04-08T12:40:01Z
dc.date.available2015-04-08T12:40:01Z
dc.date.issued2013-05-06
dc.identifier.citationJournal of Synchrotron Radiation 20.4 (2013): 635-640en_US
dc.identifier.issn0909-0495 (print)es_ES
dc.identifier.issn1600-5775 (online)es_ES
dc.identifier.urihttp://hdl.handle.net/10486/664921
dc.description.abstractThis work reports an X-ray absorption near-edge structure (XANES) spectroscopy study at the Ni K-edge in the early stages of growth of NiO on non-ordered SiO2, Al2O3 and MgO thin films substrates. Two different coverages of NiO on the substrates have been studied. The analysis of the XANES region shows that for high coverages (80 Eq-ML) the spectra are similar to that of bulk NiO, being identical for all substrates. In contrast, for low coverages (1 Eq-ML) the spectra differ from that of large coverages indicating that the local order around Ni is limited to the first two coordination shells. In addition, the results also suggest the formation of cross-linking bonds Ni - O - M (M = Si, Al, Mg) at the interfaceen_US
dc.description.sponsorshipThis work was partially supported by the Spanish CONSOLIDER Project FUNCOAT CSD2008-00023, the ENE2010-21198-C04-04 and MAT2011-27573-C04-04 projects and by the Aragón DGA NETOSHIMA grant. We acknowledge the Spanish Ministerio de Ciencia e Innovación and CSIC for financial support and for provision of synchrotron radiation and we would like to thank the staff of SpLine at ESRF and KMC2 at BESSY II for technical support. The research leading to these results has received funding from the European Community’s Seventh Framework Programme (FP7/2007-2013) under grant agreement No. 22671en_US
dc.format.extent6 pag.es_ES
dc.format.mimetypeapplication/pdfen
dc.language.isoengen
dc.publisherInternational Union of Crystallographyen_US
dc.relation.ispartofJournal of Synchrotron Radiationen_US
dc.rights© 2013 International Union of Crystallographyen_US
dc.subject.otherNiOes_ES
dc.subject.otherXANESes_ES
dc.subject.otherOxide/oxide interfaceses_ES
dc.titleX-ray absorption study of the local structure at the NiO/oxide interfaceses_ES
dc.typearticlees_ES
dc.subject.ecienciaFísicaes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1107/S0909049513012417es_ES
dc.identifier.doi10.1107/S0909049513012417es_ES
dc.identifier.publicationfirstpage635es_ES
dc.identifier.publicationissue4es_ES
dc.identifier.publicationlastpage640es_ES
dc.identifier.publicationvolume20es_ES
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/22671es_ES
dc.type.versioninfo:eu-repo/semantics/publishedVersionen
dc.rights.accessRightsopenAccesses_ES
dc.authorUAMPreda , Iulian (263931)
dc.facultadUAMFacultad de Ciencias
dc.institutoUAMInstituto Universitario de Ciencia de Materiales Nicolás Cabrera (INC)


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