Mañana, JUEVES, 24 DE ABRIL, el sistema se apagará debido a tareas habituales de mantenimiento a partir de las 9 de la mañana. Lamentamos las molestias.
Influence of the substrate and tip shape on the characterization of thin films by electrostatic force microscopy
Author
Gómez Moñivas, SachaEntity
UAM. Departamento de Ingeniería InformáticaPublisher
IEEEDate
2013-03-19Citation
10.1109/TNANO.2012.2235081
IEEE Transactions on Nanotechnology 12.2 (2013): 152 – 156
ISSN
1536-125X (print); 1941-0085 (online)DOI
10.1109/TNANO.2012.2235081Funded by
Author acknowledges interesting discussion from J. J. Sáenz, C. Gómez-Navarro, J. Gómez-Herrero and E. Castellano-Hernández. This work was supported by TIN2010- 19607. Author acknowledges support from the Spanish Ramón y Cajal Program.Editor's Version
http://dx.doi.org/10.1109/TNANO.2012.2235081Subjects
Electrostatic force microscopy; Thin films; InformáticaNote
Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. G. M. Sacha, "Influence of the Substrate and Tip Shape on the Characterization of Thin Films by Electrostatic Force Microscopy", IEEE Transactions on Nanotechnology, vol.12, no.2, pp.152-156, Marzo 2013.Rights
© 2013 IEEEAbstract
Electrostatic force microscopy has been shown to be a useful tool to determine the dielectric constant of nanoscaled thin films that play a key role in many electrical, optical and biological phenomena. Previous approaches have made use of simple analytical models to analyze the experimental data for these materials. Here we show that the electrostatic force shows a completely different behavior when the shape of the tip and sample are taken into account. We present a complete study of the interaction between the whole tip and the layers below the thin film. We demonstrate that physical magnitudes such as the surface charge density distribution and the size of the materials have a strong influence on the EFM signal. The EFM sensitivity to the substrate below the thin film decreases with the substrate thickness and saturates for thicknesses above two times the length of the tip, when it is close to that of an infinite medium.
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