All-optical thermal microscopy of laser-excited waveguides
Entity
UAM. Departamento de Física de MaterialesPublisher
OSA - The Optical SocietyDate
2016-05-01Citation
10.1364/OL.41.002061
Optics Letters 41.9 (2016): 2061-2064
ISSN
0146-9592 (print); 1539-4794 (online)DOI
10.1364/OL.41.002061Funded by
This work was supported by the Spanish Ministerio de Economía y Competitividad (MINECO) under grants MAT2013-47395-C4-1-R and FIS2013-44174-P and from Junta de Castilla y León (Project SA116U13, UIC016)Project
Gobierno de España. MAT2013-47395-C4-1-R; Gobierno de España. FIS2013-44174-PEditor's Version
http://dx.doi.org/10486/10.1364/OL.41.002061Subjects
Waveguides; Rare-earth-doped materials; Spectroscopy, fluorescence and luminescence; Laser materials processing; Thermal imaging; FísicaRights
© 2016 Optical Society of AmericaAbstract
We report on a unique combination of high-resolution confocal microscopy and ratiometric luminescence thermometry to obtain thermal images of 800 nm pumped ultrafast laser-inscribed waveguides in a Nd:YAG crystal. Thermal images evidence a strong localization of thermal load in the waveguide active volume. Comparison between experimental data and numerical simulations reveals that ultrafast laser-inscribed damage tracks in Nd:YAG crystals behave both as low-index and low-thermal conductivity barriers
Files in this item
Google Scholar:He, R.
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De Aldana, J.R.V.
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Pedrola, G.L.
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Chen, F.
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Jaque García, Daniel
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