Polarization tagging of two-photon double ionization by elliptically polarized XUV pulses
EntityUAM. Departamento de Física Teórica de la Materia Condensada
PublisherAmerican Physical Society
10.1103/PhysRevA.99.023413Physical Review A 99.2 (2019): 023413
ISSN2469-9934 (online); 2469-9926 (print)
Funded byThis work was supported by the WWTF through Project No. MA14-002, and the FWF through Projects No. FWF-SFB041-VICOM, No. FWF-SFB049-NEXTlite, and No. FWF-W1243-Solids4Fun, as well as the IMPRS-APS. J.F. acknowledges support by the Spanish MINECO through a Ramón y Cajal grant and the “María de Maeztu” program for Units of Excellence in R&D (MDM-2014-0377)
ProjectGobierno de España. MDM-2014-0377
SubjectsPhotoemission; Ultrafast phenomena; Ultrashort pulses; Single and few-photon ionization & excitation; Física
Rights© 2019 American Physical Society
We explore the influence of elliptical polarization on the (non)sequential two-photon double ionization of atomic helium with ultrashort extreme ultraviolet (XUV) light fields using time-dependent full ab initio simulations. The energy and angular distributions of photoelectrons are found to be strongly dependent on the ellipticity. The correlation minimum in the joint angular distribution becomes more prominently visible with increasing ellipticity. In a pump-probe sequence of two subsequent XUV pulses with varying ellipticities, polarization tagging allows us to discriminate between sequential and nonsequential photoionization. This clear separation demonstrates the potential of elliptically polarized XUV fields for improved control of electronic emission processes.
Google Scholar:Donsa, Stefan - Březinová, Iva - Ni, Hongcheng - Feist, Johannes - Burgdörfer, Joachim
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