Understanding the intrinsic compression in polycrystalline films through a mean-field atomistic model

Vasco, Enrique; Ramírez-Peral, Mariá J.; García Michel, Enrique; Polop Jordá, Celia

UAM_Biblioteca

Autor (es)

Vasco, Enrique; Ramírez-Peral, Mariá J.; García Michel, Enrique

; Polop Jordá, Celia

Entidad

UAM. Departamento de Física de la Materia Condensada

Editor

IOP Publishing

Fecha de edición

2020-11-17

Cita

Journal of Physics D: Applied Physics 54.6 (2021): 065302

ISSN

0022-3727

DOI

10.1088/1361-6463/abc11c

Proyecto

Gobierno de España. FIS2017-82415-R; Gobierno de España. PCI2019-103604; Gobierno de España. CEX2018-000805-M

Versión del editor

https://doi.org/10.1088/1361-6463/abc11c

Materias

Stress and Mechanical Properties of Thin Films; Surfaces and Polycrystals; Growth and Surface Kinetics; Atomistic Modeling and Simulation; Física

URI

http://hdl.handle.net/10486/702659

Nota

This is the Accepted Manuscript version of an article accepted for publication in Journal of Physics D: Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at 10.1088/1361-6463/abc11c