Effect of film thickness and dielectric environment on optical transmission through subwavelength holes

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dc.contributor.author Carretero-Palacios, S.
dc.contributor.author García-Vidal, F. J.
dc.contributor.author Martín-Moreno, L.
dc.contributor.author Rodrigo, Sergio G.
dc.contributor.other UAM. Departamento de Física Teórica de la Materia Condensada es_ES
dc.date.accessioned 2015-06-15T16:44:26Z
dc.date.available 2015-06-15T16:44:26Z
dc.date.issued 2012-01-12
dc.identifier.citation Physycal Review B 85.3 (2012): 035417 en_US
dc.identifier.issn 1098-0121 (print) es_ES
dc.identifier.issn 1550-235X (online) es_ES
dc.identifier.uri http://hdl.handle.net/10486/666801
dc.description.abstract We present a detailed theoretical study for the spectral position of transmission resonances appearing in isolated subwavelength apertures in metallic films. We provide analytical expressions for the resonant wavelength as a function of the film thickness and the dielectrics surrounding (and filling) the system that are valid for hole shapes supporting large-cutoff wavelengths and for both isolated and periodically arranged holes. Our results are quantitatively valid in the microwave and terahertz regimes, but they also have qualitative validity in the optical regime. Our results show that for unfilled holes, in the limiting case when the hole is in a very thin film (metal thickness much smaller than the wavelength), the transmission resonance is controlled by a length scale related to the vanishing of the effective admittance of vacuum, as seen from the hole. On the contrary, for metal thicknesses larger than half the wavelength, the transmission resonance is controlled by the cutoff of the fundamental waveguide mode inside the hole. When thin films and high-index dielectrics are combined, the spectral location of the maximum transmission can be strongly redshifted compared to the cutoff wavelength of the apertures, and transmission intensity is substantially enhanced en_US
dc.description.sponsorship We acknowledge support from the Spanish Ministry of Science and Innovation (Projects MAT2008-06609-C02 and CSD2007-046-Nanolight.es) en_US
dc.format.extent 9 pag. es_ES
dc.format.mimetype application/pdf en
dc.language.iso eng en
dc.publisher The American Physical Society en_US
dc.relation.ispartof Physical Review B - Condensed Matter and Materials Physics en_US
dc.rights © 2012 American Physical Society en_US
dc.title Effect of film thickness and dielectric environment on optical transmission through subwavelength holes es_ES
dc.type article es_ES
dc.subject.eciencia Física es_ES
dc.relation.publisherversion http://dx.doi.org/10.1103/PhysRevB.85.035417 es_ES
dc.identifier.doi 10.1103/PhysRevB.85.035417 es_ES
dc.identifier.publicationfirstpage 035417 es_ES
dc.identifier.publicationissue 3 es_ES
dc.identifier.publicationlastpage 035417 es_ES
dc.identifier.publicationvolume 85 es_ES
dc.type.version info:eu-repo/semantics/publishedVersion en
dc.rights.accessRights openAccess es_ES


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