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dc.contributor.authorDíez Toledano, José Manuel 
dc.contributor.authorCuñado, José Luis F.
dc.contributor.authorLapa, Pavel
dc.contributor.authorSolís, Raúl
dc.contributor.authorArnay, Icíar
dc.contributor.authorPedraz, Patricia
dc.contributor.authorPerna, Paolo
dc.contributor.authorBollero, Alberto
dc.contributor.authorMiranda Soriano, Rodolfo 
dc.contributor.authorSchuller, Ivan K.
dc.contributor.authorCamarero de Diego, Julio 
dc.contributor.otherUAM. Departamento de Física de la Materia Condensadaes_ES
dc.date.accessioned2022-07-19T10:55:21Z
dc.date.available2022-07-19T10:55:21Z
dc.date.issued2022-06-24
dc.identifier.citationAdvanced Materials Interfaces (2022): 2200331es_ES
dc.identifier.issn2196-7350 (online)es_ES
dc.identifier.urihttp://hdl.handle.net/10486/703220
dc.description.abstractInterfacial proximity effects in antiferromagnetic/ferromagnetic (AFM/FM) bilayers control the exchange-bias (EB) phenomena exploited in most spintronic devices, although still is lack of full understanding. Discordant results, including different exchange-bias field (HE), coercivity (HC), or blocking temperature (TB) found even in similar systems, are usually ascribed to uncontrolled parameters, namely dissimilar interfacial defects, structure, and thicknesses. Here, it is shown in the very same sample that the magnetic domain structure during the magnetization reversal of the FM layer controls those mentioned effects. Simultaneous transport and vectorial-resolved magnetic measurements performed in a V2O3/Co system during warming after different field cooling (FC) procedures exhibit a strong dependence on the FC angle and the domain structure of the FM layer. Remarkably, magnetization reversal analysis reveals 35 K of variation in TB and up to a factor of two in HE. These observations can be explained within the random-field model for the interfacial exchange coupling with a fixed AFM domain structure in contact with a variable (angle-dependent) FM domain structure. The results highlight the importance of the domain structure and magnetization reversal of the FM layer (not previously considered) in the EB phenomena, with potential to tailor interfacial effects in future spintronic devicesen_US
dc.description.sponsorshipThis is a highly collaborative effort between IMDEA Nanociencia and UC San Diego. The authors thank C. Urban for help in the initial stages of this work. The sample fabrication and characterization were supported by the Department of Energy’s Office of Basic Energy Science, under grant # DE-FG02-87ER45332. The magnetic and transport measurements were supported by MINECO (Ministerio de Economía y Competitividad) (FIS2016-78591-C3-1-R, PGC2018-098613-B-C21, MAT2017-89960-R, RTI2018-097895-B-C42, PCI2019-111867-2, PID2020-116181RB-C31) and by Comunidad de Madrid Regional Government (NanomagCOST-CM, Ref. S2018/MIT-2850). J.M.D. acknowledges support from MINECO through the FPI program (BES-2017-080617). IMDEA-Nanociencia acknowledges support from the ‘Severo Ochoa’ Program for Centres of Excellence in R&D (MINECO Grants SEV-2016-0686, CEX2020-001039-S)en_US
dc.format.extent9 pag.es_ES
dc.format.mimetypeapplication/pdfen_US
dc.language.isoengen
dc.publisherWileyes_ES
dc.relation.ispartofAdvanced Materials Interfacesen_US
dc.rights© 2022 The Authorsen_US
dc.subject.otherExchange-bias phenomenaen_US
dc.subject.otherFerromagnetic domain structureen_US
dc.subject.otherLT-v-MOKEes_ES
dc.subject.otherMagnetization reversalen_US
dc.subject.otherMetal-insulator transitionen_US
dc.titleInterfacial Exchange Phenomena Driven by Ferromagnetic Domainsen_US
dc.typearticleen_US
dc.subject.ecienciaFísicaes_ES
dc.relation.publisherversionhttps://doi.org/10.1002/admi.202200331es_ES
dc.identifier.doi10.1002/admi.202200331es_ES
dc.identifier.publicationfirstpage2200331-1es_ES
dc.identifier.publicationlastpage2200331-9es_ES
dc.relation.projectIDGobierno de España. FIS2016-78591-C3-1-Res_ES
dc.relation.projectIDGobierno de España. PGC2018-098613-B-C21es_ES
dc.relation.projectIDGobierno de España. MAT2017-89960-Res_ES
dc.relation.projectIDGobierno de España. RTI2018-097895-B-C42es_ES
dc.relation.projectIDGobierno de España. PCI2019-111867-2es_ES
dc.relation.projectIDGobierno de España. BES-2017-080617es_ES
dc.type.versioninfo:eu-repo/semantics/publishedVersiones_ES
dc.rights.ccReconocimiento – NoComercial – SinObraDerivadaes_ES
dc.rights.accessRightsopenAccessen_US
dc.facultadUAMFacultad de Cienciases_ES
dc.institutoUAMInstituto Universitario de Ciencia de Materiales Nicolás Cabrera (INC)es_ES


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